✦ LIBER ✦

Mechanisms of interface trap-induced drain leakage current in off-state n-MOSFET's

✍ Scribed by Tse-En Chang; Chimoon Huang; Tahui Wang

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Interface trap effect on gate induced dr

✍ Wang, T.; Chimoon Huang; Chang, T.E.; Chou, J.W.; Chang, C.Y. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 325 KB

Off-state leakage current in n-channel M

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Investigation of back gate interface sta

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A comprehensive study of hot carrier str

✍ Tahui Wang; Lu-Ping Chiang; Nian-Kai Zous; Charng-Feng Hsu; Li-Yuan Huang; Tien- 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 251 KB

Comparison of gate-induced drain leakage

✍ Okhonin, S.; Hessler, T.; Dutoit, M. 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 773 KB

New observation and the modeling of gate

✍ Ming-Jer Chen; Jum-Chang Chao; Chia-Hsiang Chen 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 553 KB