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New observation and the modeling of gate and drain currents in off-state P-MOSFET's

โœ Scribed by Ming-Jer Chen; Jum-Chang Chao; Chia-Hsiang Chen


Book ID
114535701
Publisher
IEEE
Year
1994
Tongue
English
Weight
553 KB
Volume
41
Category
Article
ISSN
0018-9383

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