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New observation of gate current in off-state MOSFET

โœ Scribed by Ming-Jer Chen


Book ID
114538132
Publisher
IEEE
Year
1991
Tongue
English
Weight
301 KB
Volume
38
Category
Article
ISSN
0018-9383

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Diffusion model for high-temperature off
โœ T.E. Rudenko; V.I. Kilchitskaya; A.N. Rudenko ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 281 KB

In this paper off-state drain currents in long-channel inversion mode SOI MOSFETs are investigated in the range 50-320ยฐC by measurements and simulations. The behavior of high-temperature (T>200ยฐC) off-state currents is interpreted in terms of diffusion model, based on the analysis of carrier distrib