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Voltage-Splitting Technique for Reliability Evaluation of Off-State Mode of MOSFETs in Ultrathin Gate Oxides

✍ Scribed by Wu, E.; Nowak, E.

Book ID: 127391861
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 105 KB
Volume: 25
Category: Article
ISSN: 0741-3106
DOI: 10.1109/led.2004.829036

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