Off-state leakage current in n-channel MOSFET's with gate dielectrics prepared by different techniques

✍ Scribed by Zeng Xu; P.T. Lai; W.T. Ng

• Book ID: 103599378
• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 289 KB
• Volume: 28
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(95)00023-2