✦ LIBER ✦

Interface trap effect on gate induced drain leakage current in submicron N-MOSFET's

✍ Scribed by Wang, T.; Chimoon Huang; Chang, T.E.; Chou, J.W.; Chang, C.Y.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Mechanisms of interface trap-induced dra

✍ Tse-En Chang; Chimoon Huang; Tahui Wang 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 549 KB

DC pulse hot-carrier-stress effects on g

✍ Ja-Hao Chen; Shyh-Chyi Wong; Yeong-Her Wang 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 173 KB

Comparison of gate-induced drain leakage

✍ Okhonin, S.; Hessler, T.; Dutoit, M. 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 773 KB

Investigating the effects of the interfa

✍ Ling-Feng Mao 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 614 KB

A comparative study of gate direct tunne

✍ Yang, N.; Henson, W.K.; Wortman, J.J. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 230 KB

Characterization of an Oxide Trap Leadin

✍ Byoungchan Oh; Heung-Jae Cho; Heesang Kim; Younghwan Son; Taewook Kang; Sunyoung 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 690 KB