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Measurement and Analysis of Interconnect Crosstalk Due to Single Events in a 90 nm CMOS Technology

✍ Scribed by Balasubramanian, Anupama; Amusan, Oluwole A.; Bhuva, Bharat L.; Reed, Robert A.; Sternberg, Andrew L.; Massengill, Lloyd W.; McMorrow, Dale; Nation, Sarah A.; Melinger, J. S.

Book ID: 120215545
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 643 KB
Volume: 55
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2008.2000781

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