Alpha-Particle and Focused-Ion-Beam-Induced Single-Event Transient Measurements in a Bulk 65-nm CMOS Technology

✍ Scribed by Gadlage, Matthew J.; Ahlbin, Jonathan R.; Bhuva, Bharat L.; Hooten, Nicholas C.; Dodds, Nathaniel A.; Reed, Robert A.; Massengill, Lloyd W.; Schrimpf, Ronald D.; Vizkelethy, Gyorgy

• Book ID: 120280381
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 539 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2011.2112378