Measurements and Simulations of Low Dark Count Rate Single Photon Avalanche Diode Device in a Low Voltage 180-nm CMOS Image Sensor Technology

✍ Scribed by Leitner, Tomer; Feiningstein, Amos; Turchetta, Renato; Coath, Rebecca; Chick, Steven; Visokolov, Gil; Savuskan, Vitali; Javitt, Michael; Gal, Lior; Brouk, Igor; Bar-Lev, Sharon; Nemirovsky, Yael

• Book ID: 124088982
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 819 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/TED.2013.2259172