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Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing

✍ Scribed by Amusan, Oluwole A.; Massengill, Lloyd W.; Baze, Mark P.; Bhuva, Bharat L.; Witulski, Arthur F.; DasGupta, Sandeepan; Sternberg, Andrew L.; Fleming, Patrick R.; Heath, Christopher C.; Alles, Michael L.

Book ID: 121355046
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 642 KB
Volume: 54
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2007.907989

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