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Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

✍ Scribed by Amusan, O.A.; Massengill, L.W.; Baze, M.P.; Bhuva, B.L.; Witulski, A.F.; Black, J.D.; Balasubramanian, A.; Casey, M.C.; Black, D.A.; Ahlbin, J.R.; Reed, R.A.; McCurdy, M.W.

Book ID: 119962914
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 901 KB
Volume: 9
Category: Article
ISSN: 1530-4388
DOI: 10.1109/TDMR.2009.2019963

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