✦ LIBER ✦
Novel N-hit single event transient mitigation technique via open guard transistor in 65nm bulk CMOS process
✍ Scribed by Huang, PengCheng; Chen, ShuMing; Chen, JianJun; Liu, BiWei
- Book ID
- 120522954
- Publisher
- SP Science China Press
- Year
- 2012
- Tongue
- English
- Weight
- 927 KB
- Volume
- 56
- Category
- Article
- ISSN
- 1006-9321
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