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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Single Event Upsets in a 130 nm Hardened Latch Design Due to Charge Sharing

✍ Scribed by Amusan, O. A.; Sternberg, A. L.; Witulski, A. F.; Bhuva, B. L.; Black, J. D.; Baze, M. P.; Massengill, L. W.

No coin nor oath required. For personal study only.

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