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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - New Understanding of Metal-Insulator-Metal (MIM) Capacitor Degradation Behavior

โœ Scribed by Hung, Chi-Chao; Oates, Anthony S.; Lin, H. C.; Chang, Percy; Wang, J.L.; Huang, C.C.; Yau, Y.W.


Book ID
118167874
Publisher
IEEE
Year
2007
Weight
687 KB
Volume
0
Category
Article
ISBN-13
9781424409198

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