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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Data Retention Characterization of Phase-Change Memory Arrays

✍ Scribed by Gleixner, B.; Pirovano, A.; Sarkar, J.; Ottogalli, F.; Tortorelli, E.; Tosi, M.; Bez, R.

No coin nor oath required. For personal study only.

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