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Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing

✍ Scribed by Amusan, O.A.; Massengill, L.W.; Baze, M.P.; Sternberg, A.L.; Witulski, A.F.; Bhuva, B.L.; Black, J.D.

No coin nor oath required. For personal study only.

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