✦ LIBER ✦
RF circuit performance degradation due to soft breakdown and hot-carrier effect in deep-submicrometer CMOS technology
✍ Scribed by Qiang Li; Jinlong Zhang; Wei Li; Yuan, J.S.; Yuan Chen; Oates, A.S.
- Book ID
- 114554154
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 147 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9480
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