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Low Frequency Noise Characterization of 0.18 μm Si CMOS Transistors

✍ Scribed by Boutchacha, T. ;Ghibaudo, G.

Publisher: John Wiley and Sons
Year: 1998
Tongue: English
Weight: 262 KB
Volume: 167
Category: Article
ISSN: 0031-8965
DOI: 10.1002/(sici)1521-396x(199805)167:1<261::aid-pssa261>3.0.co;2-#

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