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IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors

✍ Scribed by P. Marko; M. Meneghini; S. Bychikhin; D. Marcon; G. Meneghesso; E. Zanoni; D. Pogany

Book ID: 119326682
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 855 KB
Volume: 52
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2012.06.030

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