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Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

✍ Scribed by Kim, Yu-Mi; Jeong, Kwang-Seok; Yun, Ho-Jin; Yang, Seung-Dong; Lee, Sang-Youl; Lee, Hi-Deok; Lee, Ga-Won


Book ID
121615444
Publisher
The Korean Institute of Metals and Materials
Year
2013
Tongue
English
Weight
780 KB
Volume
9
Category
Article
ISSN
1738-8090

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