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Improvement in the negative bias illumination temperature stress instability of In–Ga–Zn–O thin film transistors using an Al2O3 buffer layer

✍ Scribed by Jeong Hwan Kim; Un Ki Kim; Yoon Jang Chung; Cheol Seong Hwang


Book ID
112183181
Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
266 KB
Volume
5
Category
Article
ISSN
1862-6254

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