A Two-Stage Degradation Model of p-Channel Low-Temperature Poly-Si Thin-Film Transistors Under Positive Bias Temperature Stress

✍ Scribed by Xiaowei Lu; Mingxiang Wang; Man Wong

• Book ID: 114620618
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 741 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2160949