Thermal Degradation Under Pulse Operation in Low-Temperature p-Channel Poly-Si Thin-Film Transistors

✍ Scribed by Shinichiro Hashimoto; Koji Kitajima; Yukiharu Uraoka; Takashi Fuyuki; Yukihiro Morita

• Book ID: 114618589
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 539 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.888724