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Finite element analysis of temperature distribution of polycrystalline silicon thin film transistors under self-heating stress

✍ Scribed by Huaisheng Wang; Mingxiang Wang; Zhenyu Yang

Book ID: 107375186
Publisher: SP Higher Education Press
Year: 2009
Tongue: English
Weight: 407 KB
Volume: 4
Category: Article
ISSN: 1673-3584
DOI: 10.1007/s11460-009-0023-0

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