Degradation Behaviors of Metal-Induced Laterally Crystallized n-Type Polycrystalline Silicon Thin-Film Transistors Under DC Bias Stresses

✍ Scribed by Min Xue; Mingxiang Wang; Zhen Zhu; Dongli Zhang; Man Wong

• Book ID: 114618588
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 304 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.888723