✦ LIBER ✦
WITHDRAWN: Investigating degradation behavior of InGaZnO thin-film transistors induced by charge-trapping effect under DC and AC gate bias stress
✍ Scribed by Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te
- Book ID
- 123379912
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 901 KB
- Volume
- 528
- Category
- Article
- ISSN
- 0040-6090
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