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Water-enhanced negative bias temperature instability in p-type low temperature polycrystalline silicon thin film transistors

✍ Scribed by Zhang, Meng; Zhou, Wei; Chen, Rongsheng; Wong, Man; Kwok, Hoi-Sing

Book ID: 122242000
Publisher: Elsevier Science
Year: 2014
Tongue: English
Weight: 589 KB
Volume: 54
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2013.07.082

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