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Investigation of Minority Carrier Diffusion Length in Multicrystalline Silicon by Quantitative Electron Beam Induced Current Mapping

✍ Scribed by Barhdadi, A.; Sivoththaman, S.; Barbe, M.; Rodot, M.; Maurice, J.L.

Book ID: 120392992
Publisher: Trans Tech Publications, Ltd.
Year: 1994
Tongue: English
Weight: 672 KB
Volume: 37-38
Category: Article
ISSN: 1662-9779
DOI: 10.4028/www.scientific.net/SSP.37-38.189

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