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A method for investigation of fluctuations in doping concentration and minority-carrier diffusion length in semiconductors by scanning electron microscope

✍ Scribed by J.D. Kamm

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 552 KB
Volume: 19
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(76)90103-9

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