Interpretation of scanning electron microscope measurements of minority carrier diflusion lengths in semiconductors : A. Flat and A. G. Milnes. Int. J. Electron.44, (6) 629 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 120 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90543-7