A method for investigation of fluctuations in doping concentration and minority-carrier diffusion length in semiconductors by scanning electron microscope : J. D. Kamm. Solid-St. Electron.19, 921 (1976)

• Publisher: Elsevier Science
• Year: 1977
• Tongue: English
• Weight: 232 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(77)90094-4