✦ LIBER ✦
Measurement of minority carrier lifetime and diffusion length in silicon epitaxial layers by means of the photo-current technique : J. Muller, H. Bernt and H. Reichl. Solid-St. Electron. 21, 999 (1978)
- Publisher
- Elsevier Science
- Year
- 1979
- Tongue
- English
- Weight
- 130 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.