Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current

✍ Scribed by Kushida, T.; Tanaka, S.; Morita, C.; Tanji, T.; Ohshita, Y.

• Book ID: 118053820
• Publisher: Oxford University Press
• Year: 2012
• Tongue: English
• Weight: 218 KB
• Volume: 61
• Category: Article
• ISSN: 0022-0744
• DOI: 10.1093/jmicro/dfs050