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Evaluation of minority carrier diffusion length of undoped n-BaSi 2 epitaxial thin films on Si(001) substrates by electron-beam-induced-current technique

✍ Scribed by Baba, Masakazu; Watanabe, Kentaro; Hara, Kosuke O.; Toko, Kaoru; Sekiguchi, Takashi; Usami, Noritaka; Suemasu, Takashi


Book ID
125482165
Publisher
Institute of Pure and Applied Physics
Year
2014
Tongue
English
Weight
522 KB
Volume
53
Category
Article
ISSN
0021-4922

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