Improved high-temperature etch processin
Improved high-temperature etch processing of high-k metal gate stacks in scaled TANOS memory devices
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J. Paul; V. Beyer; M. Czernohorsky; M.F. Beug; K. Biedermann; M. Mildner; P. Mic
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Article
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2010
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Elsevier Science
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English
โ 557 KB