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Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs

✍ Scribed by Juin J. Liou; R. Shireen; A. Ortiz-Conde; F.J. Garcı́a Sánchez; A. Cerdeira; X. Gao; Xuecheng Zou; C.S. Ho

No coin nor oath required. For personal study only.

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