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Influence of defects upon the forward bias admittance of metal-semiconductor interfaces

✍ Scribed by P. Muret; D. Elguennouni; M. Missous; E.H. Rhoderick; R. Baptist; A. Pellissier

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
295 KB
Volume
56-58
Category
Article
ISSN
0169-4332

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