Interface edge effect and its contribution to the frequency dispersion of metal-oxide-semiconductor admittance : Y. C. Sun and C. T. Sah. Solid-St. Electron.24, 569 (1981)

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 252 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90177-3