Interface edge effect and its contribution to the frequency dispersion of metal-oxide-semiconductor admittance

✍ Scribed by Y.C. Sun; C.T. Sah

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 732 KB
• Volume: 24
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(81)90078-2