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EXAFS studies of the microstructure of semiconductor alloys, defects, and metal-semiconductor interfaces

✍ Scribed by Bruce A. Bunker; Quazi T. Islam; Pathikrit Bandyopadhyay; Way-Faung Pong


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
374 KB
Volume
4
Category
Article
ISSN
0749-6036

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