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Impact of gate tunneling leakage on the operation of NMOS transistors with ultra-thin gate oxides

✍ Scribed by F Lime; R Clerc; G Ghibaudo; G Pananakakis; G Guégan


Book ID
108411197
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
186 KB
Volume
59
Category
Article
ISSN
0167-9317

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