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Gate leakage current of NMOSFET with ultra-thin gate oxide

✍ Scribed by Shi-gang Hu 胡仕刚, Xiao-Feng Wu 吴笑峰, Zai-fang Xi 席在芳

Book ID
118818302
Publisher
Central South University
Year
2012
Tongue
English
Weight
519 KB
Volume
19
Category
Article
ISSN
2095-2899

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