✦ LIBER ✦

Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides

✍ Scribed by Min-Hsiung Hsieh; Shuen-Lin Jeng

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Gate leakage current of NMOSFET with ult

✍ Shi-gang Hu 胡仕刚, Xiao-Feng Wu 吴笑峰, Zai-fang Xi 席在芳 📂 Article 📅 2012 🏛 Central South University 🌐 English ⚖ 519 KB

An improved substrate current model for

✍ Lin-An Yang; Yue Hao; Chun-Li Yu; Feng-Yan Han 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 237 KB

Calculation of Direct Tunneling Current

✍ Atsushi Sakai; Akihiro Ishida; Shigeyasu Uno; Yoshinari Kamakura; Masato Morifuj 📂 Article 📅 2002 🏛 Springer 🌐 English ⚖ 74 KB

Effect of stress voltages on voltage acc

✍ W.W. Abadeer 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 936 KB

Degradation of thin tunnel gate oxide un

✍ Young-Bog Park; Schroder, D.K. 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 241 KB

[IEEE 2004 IEEE International Reliabilit

✍ Lai, W.; Sune, J.; Wu, E.; Nowak, E. 📂 Article 📅 2004 🏛 IEEE ⚖ 447 KB