✦ LIBER ✦
Effect of stress voltages on voltage acceleration and lifetime projections for ultra-thin gate oxides
✍ Scribed by W.W. Abadeer
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 936 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0026-2714
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