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A quantum mechanical treatment of low frequency noise in high-K NMOS transistors with ultra-thin gate dielectrics

✍ Scribed by Zhang, Xiaochen; White, Marvin H.


Book ID
118203154
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
485 KB
Volume
78
Category
Article
ISSN
0038-1101

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