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Impact of gate-to-source/drain overlap length on 80-nm CMOS circuit performance

✍ Scribed by Maitra, K.; Bhat, N.

Book ID: 114617335
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 286 KB
Volume: 51
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2003.822347

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