✦ LIBER ✦

[IEEE 2008 Symposium on VLSI Technology - Honolulu, HI, USA (2008.06.17-2008.06.19)] 2008 Symposium on VLSI Technology - Impact of source-to-channel carrier injection properties on device performance of sub-100nm metal source/drain Ge-pMOSFETs

✍ Scribed by Takeda, H.; Yamamoto, T.; Ikezawa, T.; Kawada, M.; Takagi, S.; Hane, M.

No coin nor oath required. For personal study only.

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