𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - C-V extraction method for gate fringe capacitance and gate to source-drain overlap length of LDD MOSFET

✍ Scribed by Jae-Rok Kahng, ; Jang-Won Moon, ; Jin-Hyoung Kim,

Book ID: 126735879
Publisher: IEEE
Year: 2001
Weight: 430 KB
Category: Article
ISBN-13: 9780780365117
DOI: 10.1109/ICMTS.2001.928638

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE ICMTS 2001. Proceedings of the 200

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Test chips for evaluating strong phase shift lithography

✍ Ashton, R.A.; Kane, B.C.; Blatchford, J.W.; Shuttleworth, D.M. 📂 Article 📅 2001 🏛 IEEE ⚖ 489 KB

[IEEE ICMTS 2001. Proceedings of the 200

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Channel width and length dependent flicker noise characterization for n-MOSFETs

✍ Aoki, H.; Shimasue, M. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 365 KB

[IEEE ICMTS 2001. Proceedings of the 200

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - A new approach to characterize substrate losses of on-chip inductors

✍ Schimpf, L.; Benna, B.; Proetel, D. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 271 KB

[IEEE ICMTS 2001. Proceedings of the 200

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Modeling of non-linear polysilicon resistors for analog circuit design

✍ Virkus, R.; Weiser, D.; Green, K.; Richardson, D.; Westphal, G. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 236 KB

[IEEE ICMTS 2001. Proceedings of the 200

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Evaluation of high-performance SOI complementary BiCMOS devices by using test structures

✍ Tamaki, Y.; Iwasaki, T.; Tsuji, K.; Chida, Y.; Tomatsuri, T.; Yoshida, E.; Kumaz 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 397 KB

[IEEE ICMTS 2001. Proceedings of the 200

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Resistor matching characterization for process development using D/A converter

✍ Katakam, S.; Tranchina, B.; Bordelon, J.; Ramaswamy, A.; Wooyoung Choi, ; Chu, S 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 402 KB