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[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Resistor matching characterization for process development using D/A converter

✍ Scribed by Katakam, S.; Tranchina, B.; Bordelon, J.; Ramaswamy, A.; Wooyoung Choi, ; Chu, S.

Book ID: 118028985
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 402 KB
Volume: 0
Category: Article
ISBN-13: 9780780365117
DOI: 10.1109/icmts.2001.928665

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