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[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Evaluation of high-performance SOI complementary BiCMOS devices by using test structures

✍ Scribed by Tamaki, Y.; Iwasaki, T.; Tsuji, K.; Chida, Y.; Tomatsuri, T.; Yoshida, E.; Kumazawa, J.; Kamada, C.

Book ID: 111864560
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 397 KB
Volume: 0
Category: Article
ISBN-13: 9780780365117
DOI: 10.1109/icmts.2001.928670

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